技术参数:
1. 元素分析范围从钠(Na)到铀(U)
Measurable elements: Na-U
2.. 元素含量分析范围为1ppm到99.99%
Element content: 1ppm-99.99%
3. 低检出限:1ppm
Detection limit: 1ppm
3. 测量时间:60-200秒(可调)
Measurement time: 60-200s (adjustable)
4. 仪器工作电源:AC220±5V
Power:AC220±5V
5. 能量分辨率为129±5eV
Energy resolution: 129±5 eV
6. X 射线光管大输出电流:1mA
X-ray tube maximum output current: 1mA
7. 极限压力:6.7×10-2 Pa
Ultimate pressure:6.7×10-2 Pa
8.样品腔尺寸:610*320*100(mm)(不抽真空)/Φ100*h75(mm) (真空样品腔)
Sample chamber size: 610*320*100(mm) (Without vacuum)/Φ100*h75(mm) (Vacuum)
9.多次测量重复性(以标准样品为硅漂移探测器,分辨率更高, 大大提高了轻元素的检出限,标准检出限较SI-PIN探测器提高100倍;测量范围更宽,基本涵盖了各种常规材料元素分析要求;
The silicon draft detector imported from America with higher energy resolution largely improves the detection limit of light elements which is 100 times higher than that of Si-pin detector. Measurement scope is wider which can almost meet element analysis requirements of all conventional material.
2. 配置美国数据集成处理系统,数据采集速度更快,测量更稳定,重复性和长期稳定性更好;
Data integration processing system imported from America makes data acquisition faster, measurement more stable with excellent repeatability and long-time stability.
3. 配置新开发的专用测量软件,集成多种图形计算方法,测量数据更精准,更稳定;
Up-to-date software integrating multiple image computering methods makes data measurement more accurate and stable.
4. 软件全面监控仪器主要核心部件运行状态,使用更安全;
Software full monitors core parts running ensures safe operation.
5. 配置专门开发的真空系统,真空性能更好,测试效果更佳;
Specialized vacuum system offers better vacuum performance and excellent testing results.